发明名称 METHOD OF FORMING METAL WIRING FOR FILLING RECESSED AREA
摘要 PROBLEM TO BE SOLVED: To provide the metal (for instance, copper) wiring of a semiconductor element capable of improving the charging characteristics of a metal film, and its manufacturing method. SOLUTION: One or more insulating layers (32) are formed on a substrate (30), and the metal wiring is formed by electrically plating a diffusion blocking layer and a seed layer (34) on a recess formed on the substrate before electrically plating a metal layer for filling the recess formed on the insulating layer (32). Thereafter, the seed layer is formed on the blocking layer and then electrolytically polished (36), and after the electrolytic polishing of the seed layer, a copper substance layer is formed on the polished seed layer by using an electric plating process (38) to fill the recess. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008085299(A) 申请公布日期 2008.04.10
申请号 JP20070174228 申请日期 2007.07.02
申请人 SAMSUNG ELECTRONICS CO LTD 发明人 OH JUN-HWAN;KIM HYOUNG-SHICK;CHUNG JU-HYUCK;KIM IL-GOO
分类号 H01L21/3205;C25D5/34;C25D7/12;H01L23/52 主分类号 H01L21/3205
代理机构 代理人
主权项
地址