发明名称 |
X-ray source and fluorescent X-ray analyzing apparatus |
摘要 |
The present invention relates to an X-ray source for emitting a characteristic X-ray and a fluorescent X-ray analyzing apparatus using the X-ray source. A secondary target is arranged in superposition on a primary target. An electron beam generated by an electron gun enters the primary target, which passes and emits a continuous X-ray. The secondary target transmits and emits a characteristic X-ray excited by the continuous X-ray emitted from the primary target. The primary target and the secondary target are superposed one on the other, so that the continuous X-ray emitted from the primary target efficiently excites the secondary target thereby to efficiently generate the characteristic X-ray.
|
申请公布号 |
US2008084966(A1) |
申请公布日期 |
2008.04.10 |
申请号 |
US20070905911 |
申请日期 |
2007.10.05 |
申请人 |
TOSHIBA ELECTRON TUBES & DEVICES CO., LTD. |
发明人 |
AOKI NOBUTADA;KAKUTANI AKIKO |
分类号 |
H01J35/02;H01J35/18 |
主分类号 |
H01J35/02 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|