发明名称 |
Verfahren zur Herstellung einer Nitrid-basierten Verbindungsschicht, eines GaN-Substrats und einer Nitrid-basierten Halbleiter-Leuchtvorrichtung mit vertikaler Struktur |
摘要 |
The method involves forming a mask layer (22) with predetermined pattern on a prepared gallium nitride substrate (21) to expose a partial area of the gallium nitride substrate. A buffer layer (23) is formed on the partially exposed gallium nitride substrate. Nitride-based compound is laterally grown from the top surface of the buffer towards the top surface of the mask layer to vertically grow the nitride-based compound layer to predetermined thickness. The mask layer and buffer layer are removed via wet etching to separate the nitride-based compound layer from the gallium nitride substrate. The buffer layer is made of a material having 10 percent or less lattice mismatch with gallium nitride. The buffer layer contains zinc oxide and gallium trioxide. The mask layer includes a silicon oxide film and a silicon nitride film. The wet etching solution used in the wet etching process contains hydrogen chloride and hydrogen fluoride. Independent claims are included for the following: (1) fabrication of the gallium nitride substrate; and (2) fabrication of the vertical nitride semiconductor light emitting device. |
申请公布号 |
DE102006028137(B4) |
申请公布日期 |
2008.04.10 |
申请号 |
DE20061028137 |
申请日期 |
2006.06.16 |
申请人 |
SAMSUNG ELECTRO-MECHANICS CO. LTD. |
发明人 |
LEE, SOO MIN;KIM, CHEOL KYU;YOO, JAEUN;JANG, SUNG HWAN;KOIKE, MASAYOSHI |
分类号 |
C30B25/02;H01L21/32;H01L33/00;H01L33/06;H01L33/12;H01L33/32;H01L33/42 |
主分类号 |
C30B25/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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