发明名称 ILLUMINANCE MEASURING DEVICE AND ILLUMINANCE MEASURING METHOD
摘要 PROBLEM TO BE SOLVED: To measure illuminance irregularity in a display region of a liquid crystal device, for example. SOLUTION: A light incidence plane S1 can be irradiated with a plurality of lights L3 by a plurality of parallelizing lens 204, so that the incidence angle which is the angle formed by the optical axis P1 and light incidence plane S1 when each of the plurality of lights L3 comes into the light incidence plane S1 in each region of the light incidence plane S1 can be aligned mutually for the plurality of lights L3. Therefore, based on the illuminance obtained by measuring transmitted light emitted from a plurality of regions 10b included in an image display region 10a, the illuminance irregularity in the image display region 10a can be quantified and evaluated. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008082878(A) 申请公布日期 2008.04.10
申请号 JP20060263030 申请日期 2006.09.27
申请人 SEIKO EPSON CORP 发明人 SAKAGUCHI MASASHI
分类号 G01M11/00;G01J1/02;G02F1/13 主分类号 G01M11/00
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