METHOD FOR MEASURING AN OBJECT USING AN X-RAY SENSOR SYSTEM

摘要

The invention relates to a method for measuring an object (1; 103) using an X-ray sensor system having an X-radiation source (101) emitting X-rays (102) in the direction of the object (1; 103) and a detector (106) detecting the X-rays (102), wherein the surface of the object (1; 103) is brought into contact with a substance (6) which has an X-ray attenuation coefficient which is higher than the X-ray attenuation coefficient of the material of the surface of the object (1; 103).