| 摘要 |
PROBLEM TO BE SOLVED: To provide a sectional sample stand for a scanning electron microscope and a sample holder which facilitate sample setting for efficient observation of a number of samples, and also facilitate horizontal setting of a sample without touching an observation surface to make highly skilled manipulation unnecessary. SOLUTION: The sample stand is used to put a sectional sample in an erected position in a scanning electron microscope. The sample stand includes samples stand 1 and 2 which hold part of the sectional sample between them, and a cramping means which cramps the held sectional sample. A sample holder of a section cutting device for preparing a scannable sectional sample includes a sample stand bearing board having a bearing surface parallel with a cutting face, and a cramping means for fixing the sample stand. COPYRIGHT: (C)2008,JPO&INPIT
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