发明名称 SOLID-STATE IMAGING APPARATUS AND SMEAR CORRECTION METHOD
摘要 PROBLEM TO BE SOLVED: To provide a smear correction method and solid-state imaging apparatus in which an average of outputs of a plurality of pixels is calculated for each column skipping in an OB pixel region at intervals of two lines, and subtracted from outputs of effective pixels. SOLUTION: The solid-state imaging apparatus comprises: a photoelectric conversion unit including a color filter wherein columns of a first color pattern and columns of a second color pattern are alternately arrayed, and being composed of an effective pixel region where light from a subject is received, and an ineffective pixel region where light is shielded; a first average calculating means for calculating a first average of output signals of the photoelectric conversion unit regarding the columns of the first color pattern in the ineffective pixel region; a second average calculating means for calculating a second average of the output signals of the photoelectric conversion unit regarding the columns of the second color pattern in the ineffective pixel region; and a correction means which subtracts the first average calculated by the first average calculating means from the output signals of the photoelectric conversion unit regarding the columns of the first color pattern in the effective pixel region, and subtracts the second average calculated by the second average calculating means from the output signals of the photoelectric conversion unit regarding the columns of the second color pattern in the effective pixel region. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008085855(A) 申请公布日期 2008.04.10
申请号 JP20060265407 申请日期 2006.09.28
申请人 NIKON CORP 发明人 TAKEBAYASHI TOMOHARU;SUZUKI KATSUYUKI
分类号 H04N9/07;H04N5/335;H04N5/359;H04N5/369;H04N5/376;H04N5/378 主分类号 H04N9/07
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