| 摘要 |
PROBLEM TO BE SOLVED: To provide a generation device or the like for generating a test vector, capable of effectively reducing consumption electric power at capturing. SOLUTION: A generation device 100 assigns logic values to a plurality of undecided value bits contained in a test cube regarding a logic circuit to generate a test vector, and includes a selecting section 101 for selecting one assignment object undecided value bit from a plurality of undecided value bits, a capture transition number digitizing section 103 for calculating capture transition numbers obtained due to the test cube containing the undecided value bits, and a logic value assignment section 105 in which, for a first test cube obtained by assigning the logic value 0 to the selected assignment object undecided value bit and a second test cube obtained by assigning the logic value 1 to the selected assignment object undecided value bit, the capture transition number digitizing section 103 is applied, the capture transition number obtained by the first test tube is compared with that by the second test cube, and the logic value corresponding to the smaller one of the capture transition numbers whichever may be is assigned to the selected assignment object undecided value bit. COPYRIGHT: (C)2008,JPO&INPIT
|
