发明名称 TAPERED VOLTAGE POLYSILICON DIODE ELECTROSTATIC DISCHARGE CIRCUIT FOR POWER MOSFETS AND ICS
摘要 <p>An electrostatic discharge (ESD) protection network for power MOSFETs includes parallel branches, containing polysilicon zener diodes and resistors, used for protecting the gate from rupture caused by high voltages caused by ESD. The branches may have the same or independent paths for voltage to travel across from the gate region into the semiconductor substrate. Specifically, the secondary branch has a higher breakdown voltage than the primary branch so that the voltage is shared across the two branches of the protection network. The ESD protection network of the device provides a more effective design without increasing the space used on the die. The ESD protection network can also be used with other active and passive devices such as thyristors, insulated-gate bipolar transistors, and bipolar junction transistors.</p>
申请公布号 WO2008042843(A2) 申请公布日期 2008.04.10
申请号 WO2007US80069 申请日期 2007.10.01
申请人 FAIRCHILD SEMICONDUCTOR CORPORATION;CALAFUT, DANIEL, S.;YILMAZ, HAMZA;SAPP, STEVEN 发明人 CALAFUT, DANIEL, S.;YILMAZ, HAMZA;SAPP, STEVEN
分类号 H01L27/06 主分类号 H01L27/06
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