ELECTRONIC COMPONENT TESTING APPARATUS

摘要

Provided is an electronic component testing apparatus for testing an IC device (IC) by bringing the IC device (IC) into electrical contact with a contact section of a test head. The electronic component testing apparatus is provided with a device transfer apparatus (310) for transferring the IC device (IC) from a customer tray (800) positioned at a window section of a loader section to a test tray. The device transfer apparatus (310) is provided with a holding head (340) for holding the IC device (IC), and the holding head (340) holds the IC device (IC) stored in the customer tray (800) by bringing the IC device (IC) close from a noncontact state.