发明名称 Systems and methods for cleaning a chamber window of an EUV light source
摘要 Systems and methods are disclosed for cleaning a chamber window of an extreme ultraviolet (EUV) light source. The window may have an inside surface facing a chamber interior and an opposed outside surface and the light source may generate debris by plasma formation. For the system, a subsystem may be positioned outside the chamber and may be operable to pass energy through the window to heat debris accumulating on the inside surface of the window. In a first embodiment, the subsystem may place a flowing, heated gas in contact with the outside surface of the window. In another embodiment, electromagnetic radiation may be passed through the window.
申请公布号 US7355191(B2) 申请公布日期 2008.04.08
申请号 US20050288868 申请日期 2005.11.28
申请人 CYMER, INC. 发明人 BYKANOV ALEXANDER N.;MARX WILLIAM F.
分类号 G01J3/10 主分类号 G01J3/10
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