发明名称 MINUTE STRUCTURE INSPECTION DEVICE, INSPECTION METHOD, AND INSPECTION PROGRAM
摘要 There are provided an inspection device, an inspection method, and an inspection program for accurately inspecting a minute structure having a movable portion by using a simple method. A test sound wave is inputted and frequency characteristic of a sensor output voltage amplitude responding to the input of the test sound wave is analyzed. The maximum frequency and the minimum frequency of the device is calculated from estimated use conditions and it is judged whether it is possible to detect a desired characteristic in the frequency band. More specifically, the device is judged to be good or bad depending whether the response characteristic in a predetermined frequency band exceeds the minimum characteristic level as a threshold value.
申请公布号 KR20080031346(A) 申请公布日期 2008.04.08
申请号 KR20087002357 申请日期 2008.01.29
申请人 TOKYO ELECTRON LTD. 发明人 YAKABE MASAMI;IKEUCHI NAOKI
分类号 G01P21/00;H01L21/027 主分类号 G01P21/00
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