| 摘要 |
Methods and systems are provided for testing circuits having electronic devices. In one embodiment, an electronic device test adapter comprises a base interface section, at least one test interface section, and at least one flexible section. The base interface section includes a device side attach pad interface and a printed wiring assembly side attach pad interface. The base interface section is adapted to mount onto a printed wiring assembly device. The device side attach pad interface and the printed wiring assembly side attach pad interface are adapted to communicate one or more signals between the electronic device and the printed wiring assembly device. The at least one test interface section includes a testing interface, wherein the base interface section, the at least one flexible section, and the at least one test interface section are adapted to communicate the one or more signals communicated between the electronic device and the printed wiring assembly device to the testing interface.
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