发明名称 Integrated circuit and method for reading from resistance memory cells
摘要 A method and apparatus for reading from a memory arrangement, in particular, for reading from a CBRAM or another memory arrangement based on resistively switching memory cells includes charging a bit line to a voltage value, discharging the bit line by a cell resistance, and subsequently assessing a resulting voltage difference in a measuring device, in particular, a differential sense amplifier.
申请公布号 US7355898(B2) 申请公布日期 2008.04.08
申请号 US20050227429 申请日期 2005.09.16
申请人 INFINEON TECHNOLOGIES AG 发明人 ROEHR THOMAS
分类号 G11C11/34;G11C16/04 主分类号 G11C11/34
代理机构 代理人
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