发明名称 CIRCUIT OF CONTROLLING A WORD LINE VOLTAGE OF MEMORY DEVICE AND METHOD OF OPERATING THE SAME
摘要 A circuit of controlling a word line voltage of a memory device and a method of operating the same are provided to enable a word line to discharge a voltage rapidly regardless of the density of a chip. A normal pump(101) provides a bias voltage to a word line of a memory device during program or read operation of the memory device. A negative pump(102) discharges a bias voltage charged to the word line, after the program or read operation is completed. A MUX(103) connects the output of the normal pump or the negative pump to the word line selectively.
申请公布号 KR20080030214(A) 申请公布日期 2008.04.04
申请号 KR20060095983 申请日期 2006.09.29
申请人 HYNIX SEMICONDUCTOR INC. 发明人 PARK, WON SUN
分类号 G11C16/30;G11C16/08 主分类号 G11C16/30
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