| 摘要 |
This invention provides a semiconductor test system including a test pattern generating portion for generating a test pattern data including a test signal for testing a device under test, at a predetermined timing, a driver for inputting the test pattern data generated by the test pattern generating portion into the device under test by way of a transmission line, and an adjustment DA converter for setting a voltage value of a high level or a low level signal inputted by the driver, to a voltage value of an adjustment high level or an adjustment low level adjusted in accordance with a characteristic of the transmission line.
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