发明名称 RADIATION SYSTEM AND LITHOGRAPHIC APPARATUS COMPRISING THE SAME
摘要 <p>An optical sensor apparatus for use in an extreme ultraviolet lithographic system is disclosed. The apparatus includes an optical sensor comprising a sensor surface and a removal mechanism configured to remove debris from the sensor surface. Accordingly, dose and/or contamination measurements may be carried out conveniently for the lithographic system.</p>
申请公布号 WO2008039068(A2) 申请公布日期 2008.04.03
申请号 WO2007NL50466 申请日期 2007.09.25
申请人 ASML NETHERLANDS B.V.;KONINKLIJKE PHILIPS ELECTRONICS N.V.;VAN HERPEN, MAARTEN MARINUS JOHANNES WILHELMUS;BANINE, VADIM YEVGENYEVICH;FRANKEN, JOHANNES CHRISTIAAN LEONARDUS;FRIJNS, OLAV WALDEMAR VLADIMIR;KLUNDER, DERK JAN WILFRED;DRIESSEN, NIELS MACHIEL;SOER, WOUTER ANTHON 发明人 VAN HERPEN, MAARTEN MARINUS JOHANNES WILHELMUS;BANINE, VADIM YEVGENYEVICH;FRANKEN, JOHANNES CHRISTIAAN LEONARDUS;FRIJNS, OLAV WALDEMAR VLADIMIR;KLUNDER, DERK JAN WILFRED;DRIESSEN, NIELS MACHIEL;SOER, WOUTER ANTHON
分类号 G03F7/20 主分类号 G03F7/20
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