发明名称 METHOD OF PATTERNING ANTI-REFLECTIVE COATING BY PARTIAL ETCHING
摘要 PROBLEM TO BE SOLVED: To provide a method of patterning a thin film (220). SOLUTION: The method comprises a step for forming the thin film (220) to be patterned on a substrate (210), a step for forming an anti-reflective coating (ARC) layer (240) on the thin film (220), and a step for forming a mask layer (250) on the (ARC) layer (240). Thereafter, the mask layer (250) is patterned to form a pattern (254) therein. The pattern (254) is partially transferred to the ARC layer (240) using a transfer process such as an etching process, to form the ARC pattern (242). Once the mask layer (250) is removed, the pattern (242) is completely transferred to the ARC layer (240) using an etching process, and the pattern (242) in the ARC layer (240) is transferred to the underlying thin film (220). COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008078649(A) 申请公布日期 2008.04.03
申请号 JP20070238098 申请日期 2007.09.13
申请人 TOKYO ELECTRON LTD;TOKYO ELECTRON AMERICA INC 发明人 HYLAND SANDRA L;DUNN SHANNON W
分类号 H01L21/3065;H01L21/027 主分类号 H01L21/3065
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