发明名称 FIELD EFFECT TRANSISTOR
摘要 PROBLEM TO BE SOLVED: To provide a field effect transistor capable of reducing a drain capacitance per unit gate width. SOLUTION: A rectangular annular gate electrode 21(G) having four sides is formed in a first conductivity type first semiconductor region 14 having a channel formation region, a drain region 18D(D) is formed on the inner side of the gate electrode, a source region 18S(S) is formed with such a width that the channel width of a corresponding drain region is not narrowed in each region on the outer side of the four sides, that is, the gate electrode is formed on all the four sides of the drain region in a rectangular shape for transistor formation. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008078469(A) 申请公布日期 2008.04.03
申请号 JP20060257274 申请日期 2006.09.22
申请人 TEXAS INSTR JAPAN LTD;TEXAS INSTR DEUTSCHLAND GMBH 发明人 OKUMURA YOICHI;MUENS JOSEF
分类号 H01L29/78;H01L29/41;H01L29/423 主分类号 H01L29/78
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