APPARATUS AND METHOD FOR INSPECTING DEFECT

摘要

PROBLEM TO BE SOLVED: To provide a defect inspecting apparatus or the like capable of eliminating the influence of the optical characteristics of the apparatus on the inspection without requiring complicated work. SOLUTION: A characteristic distribution acquiring means 31 acquires the distribution of the optical characteristics of a camera 2 in a photographing region based on a photographed image by the camera 2. A feature amount correcting means 32 corrects the feature amount acquired via the camera 2 based on the distribution of the optical characteristics acquired by the characteristic distribution acquiring means 31. A detecting means 33 detects a defect in the screen of a liquid crystal display device 1 based on the feature amount corrected by the feature amount correcting means 32. COPYRIGHT: (C)2008,JPO&INPIT