| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide an IC tester and a testing method capable of testing characteristics of thin-type-display drivers when their output changes while reducing the test time. <P>SOLUTION: This invention is acquired by improving an IC tester which tests thin-type-display drivers. The invention is provided with both a successive approximation type A/D converter for inputting a voltage based on gradation output of thin-type-display drivers and a clock generating part for providing the successive approximation type A/D converter with a shorter sampling clock period when changes in output of the thin-type-display drivers are measured than at the time of measurement when the output of the thin-type-display drivers is stabilized. <P>COPYRIGHT: (C)2008,JPO&INPIT |
