| 摘要 |
<P>PROBLEM TO BE SOLVED: To accurately identify the surface state of an object by performing image processing of an image obtained by imaging the surface of the object, and to inspect the surface state of the object without requiring experience, knowledge, or a special device. <P>SOLUTION: The image that is obtained by imaging the surface of the object and has a score, is wavelet-converted horizontally and vertically, and a 2k-dimension feature vector E is determined for each of a plurality of images whose components are values for each resolution m of the ratio E<SP>n</SP><SB>m</SB>of frequency energy Em of the whole image in resolution (m) to the frequency energy sum of the total resolution whose maximal solution is (k), and the ratio E<SP>l</SP><SB>m</SB>of the frequency energy in the inclined direction in the resolution (m) to the frequency energy sum of the total resolution. The determined feature vector is classified according to the score by a support vector machine, and time-by-time model is constructed. The score of an image whose score is unknown is identified with the feature vector E using the constructed identification model. <P>COPYRIGHT: (C)2008,JPO&INPIT |
