发明名称 TIP FOR ANALYSIS, ITS MANUFACTURING METHOD, AND APPARATUS AND METHOD FOR ANALYSIS
摘要 <p><P>PROBLEM TO BE SOLVED: To acquire a large amount of change in both absorbance changes in absorption peaks, results of measurement by Localized Surface Plasmon Resonance (LSPR), and shifts in absorbance peak wavelengths, results of measurement by interference spectroscopy. <P>SOLUTION: A tip 1 for analysis is provided with both a porous layer 3 in which a large number of pores 6 extending in directions in parallel with one another are arranged at approximately regular intervals and in which the pores 6 are open in one surface and a metal layer 5 formed on the opening surface 4 of the porous layer 3. The metal layer 5 is formed on the opening surface 4 of the porous layer 3 and pore wall surfaces in the vicinity of opening parts of the pores 6. The porous layer 3 is preferably an anode oxidation alumina coating. The metal layer 5 is constituted by layering an underlayer including at least one type selected from among Cr, Ti, and Ni and a surface layer including at least one type selected from among Au and Ag in this order. Metal particulates are absent in the pores 6. When the adsorption of matter to surfaces of the tip 1 for analysis irradiates light to the tip 1 for analysis, the light irradiation is observed as absorbance changes and wavelength shifts due to localized surface plasmon resonance and interference effects. <P>COPYRIGHT: (C)2008,JPO&INPIT</p>
申请公布号 JP2008076313(A) 申请公布日期 2008.04.03
申请号 JP20060258045 申请日期 2006.09.22
申请人 JAPAN ADVANCED INSTITUTE OF SCIENCE & TECHNOLOGY HOKURIKU 发明人 KIM DO-KYOON;TAMIYA EIICHI
分类号 G01N21/27;G01N21/45 主分类号 G01N21/27
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