发明名称 REFLOW DEVICE
摘要 PROBLEM TO BE SOLVED: To make it easy to derive a heating temperature profile of a substrate. SOLUTION: A reflow device 1 of this invention is equipped with a conveyor 6 which conveys the substrate in a reflow furnace 3. In the reflow furnace 3, a preliminary heating portion X, a main heating portion Y and a cooling portion Z are provided in a sequential order. The substrate conveyed by the conveyor 6 is heated in each heating portion and is cooled in the cooling portion Z. Furthermore, since the reflow furnace 3 is equipped with a thermal blocking tunnel 2 which adjusts a heating temperature of the substrate, the heating temperature of the substrate can be adjusted more detailedly. In result, the heating temperature profile of a desired substrate can be easily derived. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008078510(A) 申请公布日期 2008.04.03
申请号 JP20060258019 申请日期 2006.09.22
申请人 SHARP CORP;EXCEL:KK 发明人 YAMAZAKI HIROBUMI;TAKAKURA HIROSHI
分类号 H05K3/34;B23K1/00;B23K1/008;B23K31/02;B23K101/42 主分类号 H05K3/34
代理机构 代理人
主权项
地址