发明名称 ELECTRIC POWER SOURCE NOISE MEASURING INSTRUMENT, INTEGRATED CIRCUIT, AND SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To accurately measure an electric power source noise generated in an inside of an integrated circuit. SOLUTION: This electric power source noise measuring instrument is provided with: a mutual induction inductor pair 2 comprising the first inductor arranged in an inside of the integrated circuit 10 and connected between electric power source voltages of the integrated circuit 10, and the second inductor with both ends connected to external output terminals 15a, 15b of the integrated circuit 10 and opposed to the first inductor; and an electric power source noise measuring part 5 measuring electric power source noise in the integrated circuit 10, based on a voltage waveform output from the second inductor of the mutual induction inductor pair 2 via the external output terminals 15a, 15b. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008076356(A) 申请公布日期 2008.04.03
申请号 JP20060259211 申请日期 2006.09.25
申请人 FUJITSU LTD 发明人 TAKEMOTO TAKAHITO;HARADA AKIHIKO;FURUYA KAZUHIRO
分类号 G01R31/28;H01L21/822;H01L27/04 主分类号 G01R31/28
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