发明名称 Methods of forming a pattern and methods of manufacturing a memory device using the same
摘要 In a method of forming a pattern, a sacrificial layer pattern and a stop layer pattern for preventing or reducing an epitaxial growth may be formed on a substrate. The sacrificial layer pattern may have a first hole therethrough, and the first hole partially exposes a top surface of the substrate. At least one active pattern may be formed on a bottom and a sidewall of the first hole by performing a selective epitaxial growth process on the top surface of the substrate and a sidewall of the sacrificial layer pattern. The sacrificial layer pattern and the stop layer pattern for preventing or reducing the epitaxial growth may be removed from the substrate. The at least one active pattern formed by the above method may have a finer size and an improved shaped compared to a conventional active pattern formed by directly patterning layers using a photoresist pattern. Damages in a photolithography process may be prevented or reduced from being generated.
申请公布号 US2008081442(A1) 申请公布日期 2008.04.03
申请号 US20060605266 申请日期 2006.11.29
申请人 SAMSUNG ELECTRONICS CO. LTD. 发明人 KIM MIN-SANG;LEE SUNG-YOUNG;KIM SUNG-MIN;YUN EUN-JUNG;CHOI IN-HYUK
分类号 H01L21/20 主分类号 H01L21/20
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