发明名称 LITHOGRAPHY SYSTEM, METHOD OF MANUFACTURING DEVICE, AND MASK OPTIMIZATION METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a system and method for managing better the band width restriction of a projection system. <P>SOLUTION: A lithographic system comprises an array of individually controllable elements, a projection system, datapath hardware, and a conversion system. The array of individually controllable elements is capable of modulating a radiation beam. The projection system is configured to project the modulated radiation beam onto a target portion of a substrate. The datapath hardware converts an input pattern file into a control signal for controlling the array of individually controllable elements. The conversion system is configured to convert a requested device layout pattern into an input pattern file for the datapath hardware. The input pattern file is a spatial-frequency-restricted representation of the requested device layout pattern. <P>COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008078652(A) 申请公布日期 2008.04.03
申请号 JP20070240425 申请日期 2007.09.18
申请人 ASML NETHERLANDS BV 发明人 MULCKHUYSE WOUTER FRANS WILLEM;TINNEMANS PATRICIUS ALOYSIUS J
分类号 H01L21/027;G03F7/20 主分类号 H01L21/027
代理机构 代理人
主权项
地址