发明名称 METHOD OF PRODUCING NITRIDE SEMICONDUCTOR, AND NITRIDE SEMICONDUCTOR ELEMENT
摘要 <P>PROBLEM TO BE SOLVED: To provide a method of producing a nitride semiconductor which enables to improve the crystallinity and surface state of a nitride semiconductor crystal formed on a high-temperature AlN buffer layer. <P>SOLUTION: In the method of producing a nitride semiconductor, an AlN buffer layer is laminated on a substrate for growth and a nitride semiconductor crystal is grown thereon. In this production method, the AlN buffer layer is crystal-grown at a high temperature not less than 900&deg;C, while continuously supplying an Al raw material gas for the AlN buffer layer into a reaction chamber in advance, and then, an N raw material gas is intermittently supplied thereinto. <P>COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008078613(A) 申请公布日期 2008.04.03
申请号 JP20070135604 申请日期 2007.05.22
申请人 ROHM CO LTD 发明人 SHAKUDA YUKIO
分类号 H01L21/205;H01L33/06;H01L33/12;H01L33/32;H01S5/343 主分类号 H01L21/205
代理机构 代理人
主权项
地址