| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor testing device which easily inputs into a semiconductor device, test information necessary for an operation test of the semiconductor device to be tested. SOLUTION: The semiconductor testing device has a constitution equipped with: a test information storage part for storing the test information necessary when performing the operation test of the semiconductor device to be tested, associated with an address, and outputting the test information to the semiconductor device when performing the operation test; and an address output circuit which is an address output circuit for outputting address information to the test information storage part, so that the test information storage part outputs the test information of the address specified by the address information. COPYRIGHT: (C)2008,JPO&INPIT
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