发明名称 PHOTOSENSITIVE RESIN COMPOSITION, PRODUCTION METHOD OF CURED RELIEF PATTERN USING THE SAME AND SEMICONDUCTOR DEVICE
摘要 <p>A photosensitive resin composition is provided to form a cured relief pattern having excellent mechanical properties by low-temperature curing, and to realize excellent lithographic characteristics comparable to a semiconductor photoresist. A photosensitive resin composition comprises a polymer represented by the following formula I, a photosensitizer, a compound having a methacryloyl or acryloyl group in the molecule, and a solvent. In formula I, Ar1 is a tetravalent aromatic or heterocyclic group; Ar2 is a divalent aromatic, heterocyclic, alicyclic or aliphatic group optionally having a silicon atom; Ar3 is a divalent aromatic, heterocyclic, aliphatic or alicyclic group; Ar4 is a group selected from -Ar1(OA)2- and Ar2; A is H or a protecting group: G is a monovalent organic group bound by way of a carbonyl or sulfonyl group; x is a number of 5-1,000; and y is a number of 0-900, with the proviso that at least 0.5 mol% of A in the polymer represented by formula I is a protecting group.</p>
申请公布号 KR20080029919(A) 申请公布日期 2008.04.03
申请号 KR20070098353 申请日期 2007.09.28
申请人 FUJIFILM CORPORATION 发明人 YAMANAKA TSUKASA;SATO KENICHIRO
分类号 G03F7/004 主分类号 G03F7/004
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