发明名称 BONDING STRUCTURE OF ELEMENT
摘要 PROBLEM TO BE SOLVED: To provide a manufacturing technology with which damage such as erosion to a wiring circuit is suppressed as much as possible on an element where the wiring circuit formed of Al-based alloy is directly bonded to a transparent electrode and the highly reliable element is achieved. SOLUTION: In a bonding structure of having a transparent electrode and a wiring circuit formed of Al-based alloy which is directly bonded to the transparent electrode, a taper angle of a wiring circuit side is 20°to 75°. It is desirable that Al-based alloy is Al-Ni-based alloy and it is much more desirable that it is Al-Ni-B alloy. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008078243(A) 申请公布日期 2008.04.03
申请号 JP20060253488 申请日期 2006.09.19
申请人 MITSUI MINING & SMELTING CO LTD 发明人 MATSUURA YOSHINORI;KUBOTA TAKASHI
分类号 H01L21/3205;C22C21/00;H01L23/52 主分类号 H01L21/3205
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