发明名称 |
BONDING STRUCTURE OF ELEMENT |
摘要 |
PROBLEM TO BE SOLVED: To provide a manufacturing technology with which damage such as erosion to a wiring circuit is suppressed as much as possible on an element where the wiring circuit formed of Al-based alloy is directly bonded to a transparent electrode and the highly reliable element is achieved. SOLUTION: In a bonding structure of having a transparent electrode and a wiring circuit formed of Al-based alloy which is directly bonded to the transparent electrode, a taper angle of a wiring circuit side is 20°to 75°. It is desirable that Al-based alloy is Al-Ni-based alloy and it is much more desirable that it is Al-Ni-B alloy. COPYRIGHT: (C)2008,JPO&INPIT
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申请公布号 |
JP2008078243(A) |
申请公布日期 |
2008.04.03 |
申请号 |
JP20060253488 |
申请日期 |
2006.09.19 |
申请人 |
MITSUI MINING & SMELTING CO LTD |
发明人 |
MATSUURA YOSHINORI;KUBOTA TAKASHI |
分类号 |
H01L21/3205;C22C21/00;H01L23/52 |
主分类号 |
H01L21/3205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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