发明名称 DOUBLE REFRACTIVE INDEX MEASURING INSTRUMENT, DOUBLE REFRACTIVE INDEX MEASUREMENT METHOD, PROGRAM AND RECORDING MEDIUM
摘要 PROBLEM TO BE SOLVED: To provide a double refractive index measuring instrument, capable of measuring the double refraction quantities of two axes at various angles and in various directions, and capable of grasping changes in them, and to provide a double refractive index measuring method. SOLUTION: The double refractive index measuring instrument has a phase difference measuring means for making a measuring light incident, that has an angle with respect to the vertical direction of the measuring surface of a measuring target, on the measuring target to measure the phase difference of the transmitted measuring light and a calculation processing means for operating the three-dimensional double refractive indices of two axes in the measuring surface from the measured phase difference of the measuring light. The phase difference measuring means is constituted so that an angle changes freely, with respect to the vertical direction of the measuring surface of the measuring target of the measuring light, and the measuring target is freely rotatable centered about the incident point of the measuring light, by using the vertical direction of the measuring surface as the axial center. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008076120(A) 申请公布日期 2008.04.03
申请号 JP20060253603 申请日期 2006.09.19
申请人 RICOH CO LTD 发明人 TADA TAKESHI;KOTAKA KAZUHIRO
分类号 G01N21/23 主分类号 G01N21/23
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