发明名称 |
Semiconductor device |
摘要 |
There is a problem that a reverse off-leak current becomes too large in a Schottky barrier diode. A semiconductor device of the present invention includes P-type first and second anode diffusion layers 5, 6 formed in an N-type epitaxial layer 3, N-type cathode diffusion layers 4 formed in the epitaxial layer 3, a P-type third anode diffusion layer 7, 8 formed in the epitaxial layer 3 so as to surround the first and second anode diffusion layers 5, 6 and to extend toward the cathode diffusion layers 4, and a Schottky barrier metal layer 14 formed on the first and second anode diffusion layers 5, 6.
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申请公布号 |
EP1906454(A2) |
申请公布日期 |
2008.04.02 |
申请号 |
EP20070019157 |
申请日期 |
2007.09.28 |
申请人 |
SANYO ELECTRIC CO., LTD.;SANYO SEMICONDUCTOR CO., LTD. |
发明人 |
KIKUCHI, SHUICHI;OKAWA, SHIGEAKI;NAKAYA, KIYOFUMI;TANAKA, SHUJI |
分类号 |
H01L29/866;H01L27/07;H01L29/06;H01L29/40;H01L29/47;H01L29/872 |
主分类号 |
H01L29/866 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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