发明名称 Resist composition and pattern forming method using the same
摘要 A resist composition, includes: (B) a polymer having a group capable of decomposing under an action of an acid and having a weight average molecular weight of 1,000 to 5,000, of which solubility in an alkali developer increases under an action of an acid; and (Z) a compound containing a sulfonium cation having a structure represented by formula (Z-1): wherein Y 1 to Y 13 each independently represents a hydrogen atom or a substituent, and adjacent members of Y 1 to Y 13 may combine with each other to form a ring; and Z represents a single bond or a divalent linking group.
申请公布号 EP1906241(A1) 申请公布日期 2008.04.02
申请号 EP20070019180 申请日期 2007.09.28
申请人 FUJIFILM CORPORATION 发明人 KAMIMURA, SOU;WADA, KENJI;KAWANISHI, YASUTOMO
分类号 G03F7/004;G03F7/039 主分类号 G03F7/004
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