发明名称
摘要 The invention relates to a semiconductor device manufacturing method which can provide high reliability in electric connection between an electrode of a semiconductor chip and a substrate. Sealing resin is coated in a region of a substrate where a first electrode is not formed. A semiconductor chip formed with a second electrode on its end portion is prepared and disposed so as to face to a front surface of the substrate. The end portion of the semiconductor chip is pressed from its back surface by shifting a first movable plate downward to press the second electrode into contact with the first electrode. After then, a center portion of the semiconductor chip is pressed from its back surface by shifting a second movable plate downward to fill a space between the substrate and the semiconductor chip with the sealing resin.
申请公布号 JP4070658(B2) 申请公布日期 2008.04.02
申请号 JP20030112433 申请日期 2003.04.17
申请人 发明人
分类号 H01L21/60;H01L21/44;H01L21/56;H01L21/58 主分类号 H01L21/60
代理机构 代理人
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