发明名称 |
Scanning type probe microscope and probe moving control method therefor |
摘要 |
The probe tip movement control method of the scanning probe microscope is used for a scanning probe microscope provided with a cantilever 21 having a probe tip 20 facing a sample 12 . The atomic force occurring between the probe tip and sample is measured when the probe tip scans the surface of the sample. X-, Y-, and Z-fine movement mechanisms 23, 29 , and 30 are used to relatively change the positions of the probe tip and sample. It is possible to maintain a high measurement accuracy and enable scan movement of a probe tip on a sample surface by simple control when measuring a part having a gradient in measurement of an uneven shape on a sample surface.
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申请公布号 |
US7350404(B2) |
申请公布日期 |
2008.04.01 |
申请号 |
US20060569373 |
申请日期 |
2006.02.24 |
申请人 |
HITACHI KENKI FINE TECH CO., LTD. |
发明人 |
KURENUMA TOORU;YANAGIMOTO HIROAKI;KURODA HIROSHI;MINOMOTO YASUSHI;MIWA SHIGERU;MURAYAMA KEN;KENBOU YUKIO;KUNITOMO YUUICHI;HIROKI TAKENORI;NAGANO YOSHIYUKI;MORIMOTO TAKAFUMI |
分类号 |
G01B21/30;G21K7/00;G01B5/18;G01Q10/04;G01Q10/06;G01Q30/02;G01Q60/24 |
主分类号 |
G01B21/30 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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