发明名称 Photoresist composition for deep ultraviolet lithography
摘要 The present invention relates to a photoresist composition comprising a photoacid generator and at least one polymer comprising at least one unit as described by structure 1, The invention also relates to a process for imaging the photoresist composition of the present invention, and to a process of making the polymer in the presence of an organic base.
申请公布号 US7351521(B2) 申请公布日期 2008.04.01
申请号 US20070716361 申请日期 2007.03.09
申请人 AZ ELECTRONIC MATERIALS USA CORP. 发明人 DAMMEL RALPH R.;SAKAMURI RAJ;HOULIHAN FRANCIS M.
分类号 G03F7/30;G03F7/004;G03F7/021;G03F7/039 主分类号 G03F7/30
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