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发明名称
Probe card method
摘要
A probe card method, wherein a base supports a probe pin and an electromagnet. When the probe pin contacts a magnetic-sensor terminal on a chip on a wafer, magnetic force is applied to a magnetic-field sensing section in the chip.
申请公布号
US7352175(B2)
申请公布日期
2008.04.01
申请号
US20070656518
申请日期
2007.01.23
申请人
FUJITSU LIMITED
发明人
MURATA HISANORI
分类号
G01R33/12
主分类号
G01R33/12
代理机构
代理人
主权项
地址
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