| 摘要 |
<p>A method, for reducing occurrence of short-circuit iailure in an organic functional device (101, 201, 401) comprising a first transparent electrode layer (104), a second electrode layer (105) and an organic functional layer (103) sandwiched between said first and second electrode layers (104; 105). The method comprises the steps of identifying (301) a portion of said organic functional device (101, 201, 401), said portion containing a defect (102a-g) leading to an increased risk of short-circuit failure, selecting (302) a segment (108a-g) of said second electrode layer (105), said segment corresponding to said portion, and electrically isolating (303) said segment (108a-g) from a remainder of said second electrode layer (105), thereby eliminating short-circuit failure resulting from said defect (102a-g). ® KIPO & WIPO 2008</p> |
