发明名称 PROGRAM INSPECTION DEVICE, PROGRAM INSPECTION METHOD, AND PROGRAM INSPECTION PROGRAM
摘要 PROBLEM TO BE SOLVED: To provide a program inspection device, a program inspection method, and a program inspection program, shortening test time while reducing an inspector's labor. SOLUTION: This device comprises a program analysis part 11 for analyzing a program 8 to be inspected for each function to create program analysis data 21; a coverage information analysis part 12 for creating, based on coverage information 22 obtained by executing the inspection object program 8 and the program analysis data 21, analysis data 23 composed of an activation route that is a route from an input variable and/or constant of the program 8 to an unexecuted sentence and an activation condition that is a group of input variables and/or constants to be set to satisfy a condition sentence existing in the route; and an input data creation part 13 for creating input data 24 by setting, based on the analysis data 23, appropriate values to input variables needed to be set for executing the unexecuted sentence. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008071075(A) 申请公布日期 2008.03.27
申请号 JP20060248483 申请日期 2006.09.13
申请人 TOSHIBA CORP 发明人 KONO KAZUYOSHI;ISHIBASHI TOMOKO
分类号 G06F11/28 主分类号 G06F11/28
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