| 摘要 |
PROBLEM TO BE SOLVED: To provide test data compression method applicable to System-on Chip (SoC) which can attain maximum compression, while shortening the test run time. SOLUTION: The test data compression method comprises a step for acquiring equivalent core of plural cores in the System-on Chip circuit, and a step for applying reseeding of linear feedback shift register (LFSR) for test data compression of the equivalent core. COPYRIGHT: (C)2008,JPO&INPIT
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