发明名称 COMPOSITION FOR FORMATION OF RESIST PROTECTION FILM, AND METHOD FOR FORMATION OF RESIST PATTERN USING THE SAME
摘要 <p>Disclosed are: a composition for the formation of a resist protection film, which shows less damage to a resist film, can form a good, rectangular resist pattern, and can be used regardless of the structure of a resin used in a resist composition; and a method for forming a resist pattern by using the composition. Specifically, disclosed are: a composition for the formation of a resist protection film, which comprises (a) an alkali-soluble polymer and (b) an ether-based solvent; and a method for forming a resist pattern by using the composition.</p>
申请公布号 WO2008035641(A1) 申请公布日期 2008.03.27
申请号 WO2007JP67987 申请日期 2007.09.14
申请人 TOKYO OHKA KOGYO CO., LTD.;ISHIDUKA, KEITA;TAKAYAMA, TOSHIKAZU 发明人 ISHIDUKA, KEITA;TAKAYAMA, TOSHIKAZU
分类号 G03F7/004;G03F7/11;H01L21/027 主分类号 G03F7/004
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