发明名称 |
COMPOSITION FOR FORMATION OF RESIST PROTECTION FILM, AND METHOD FOR FORMATION OF RESIST PATTERN USING THE SAME |
摘要 |
<p>Disclosed are: a composition for the formation of a resist protection film, which shows less damage to a resist film, can form a good, rectangular resist pattern, and can be used regardless of the structure of a resin used in a resist composition; and a method for forming a resist pattern by using the composition. Specifically, disclosed are: a composition for the formation of a resist protection film, which comprises (a) an alkali-soluble polymer and (b) an ether-based solvent; and a method for forming a resist pattern by using the composition.</p> |
申请公布号 |
WO2008035641(A1) |
申请公布日期 |
2008.03.27 |
申请号 |
WO2007JP67987 |
申请日期 |
2007.09.14 |
申请人 |
TOKYO OHKA KOGYO CO., LTD.;ISHIDUKA, KEITA;TAKAYAMA, TOSHIKAZU |
发明人 |
ISHIDUKA, KEITA;TAKAYAMA, TOSHIKAZU |
分类号 |
G03F7/004;G03F7/11;H01L21/027 |
主分类号 |
G03F7/004 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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