摘要 |
PROBLEM TO BE SOLVED: To suppress the formation of an island shaped oxide in laminating interface in a method of manufacturing a laminated wafer formed by directly laminating a wafer for an active layer and a wafer for a supporting substrate without interposing an insulating film and thinning the wafer for an active layer. SOLUTION: In a laminated wafer, a surface layer at least including the bonded surface of a predetermined wafer for an active layer and a wafer for a supporting substrate has an oxygen concentration of 1.0×10<SP>18</SP>(atoms/cm<SP>3</SP>, Old ASTM) or lower. COPYRIGHT: (C)2008,JPO&INPIT
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