| 摘要 |
An apparatus ( 1 ) for analysing surface properties, comprising a first radiation device ( 4 ) which emits radiation directly onto a surface ( 9 ) to be analysed, a first illumination device ( 6, 7 ) for indirectly illuminating the surface ( 9 ) to be analysed, a first radiation detector device ( 8 ) which receives at least part of the radiation thrown back from the surface ( 9 ) to be analysed and outputs at least one signal which is characteristic of this part of the radiation. According to the invention, a radiation scattering device ( 10, 11 ) is provided which is at least partially illuminated by the first illumination device ( 6, 7 ) and which transmits scattered radiation onto the surface ( 9 ) to be analysed.
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