| 摘要 |
PROBLEM TO BE SOLVED: To simultaneously determine the percentage of each crystalline phase and crystallite size, regarding a sample having a plurality of crystal phases, in a short time. SOLUTION: In this analysis method of the sample, an actual diffraction pattern of an analyzed sample is obtained by X-ray diffraction measurement, various parameters contained in an approximate calculation formula are made precise by Rietvelt-analyzing the diffraction measurement result, and the percentage (mass percentageχ) and crystallite size (crystallite diameter p) of the analyzed sample are calculated, based on the precise parameter values. In applying at least first precision processing to secondary profile parameters of the various parameters, parameters U, X and Y, of the secondary profile parameters, affect the calculation result of the percentage of each crystal phase by a relatively large amount, and crystallite size are made precise under the constraint condition, with Us, Xs and Ys of each crystal phase being respectively identical. COPYRIGHT: (C)2008,JPO&INPIT
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