发明名称 FINE PARTICLE CLASSIFICATION DEVICE AND FINE PARTICLE SAMPLER
摘要 PROBLEM TO BE SOLVED: To classify under atmospheric pressure, suspended particles having particle sizes in the submicron order which cannot be classified by conventional cascade impactors under atmospheric pressure. SOLUTION: This fine particle classification device 10 for classifying suspended particles in gas by the particle size is equipped with a coarse particle classifying part 20 for classifying suspended particles having particle sizes of 1.0μm or larger, and a fine particle sampler 30 for classifying suspended particles, having particle sizes of submicron order. The fine particle sampler 30 is provided with a filter support part 31 that has a tapered through-hole 33. Furthermore, a fine particle sampling filter 32, constituted of a fibrous material, is provided near the lower end of the through-hole 33. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008070222(A) 申请公布日期 2008.03.27
申请号 JP20060248957 申请日期 2006.09.14
申请人 KANOMAX JAPAN INC 发明人 FUKUSHIMA NOBUHIKO;OTANI YOSHIO;TAJIMA NAOKO;KATO TAKAHARU
分类号 G01N1/02;G01N15/00;G01N15/02;G01N15/06 主分类号 G01N1/02
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