| 摘要 |
This application discloses a new, and useful computer implemented method and apparatus that can be used for the determination of SEU and SET disruptions in a cell or circuit, caused by ionizing particle strikes, including those caused by neutrons (cosmic rays), alpha particles or heavy ions. The method of the present invention includes a fast simulation tool ("TFIT"), which calculates the electrical effect of a particle's impact to a cell, or a circuit. The method is used to predict the soft error rate (SER) calculations and the FIT (number of failures-in-time) performance of designated test cell's design, depending on the type of particle environment specified. The method is designed to simulate the response of the cell or circuit to the stimuli caused by a particle strike. These stimuli are modeled as a "current source" placed between the drain and the source of each struck transistor.
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