发明名称 |
MIMICKING PROGRAM VERIFY DRAIN RESISTANCE IN A MEMORY DEVICE |
摘要 |
A selected word line is biased with a program verify voltage. A predetermined quantity of unseated wad 1== that are between the selected word line and the bit line are biased with a modified V pass voltage that is determined in response to a predetermined drain resistance. In one embodiment, the predetermined quantity is all of the word lines. Other embodiments can use smaller quantities. The remaining unselected word lines are biased with a normal Vpass voltage. The modified Vpass changes the resistance of the memory cells, acting as pass-gates during the program verification operation, to mimic a resistance of already programmed memory cells. |
申请公布号 |
WO2007130556(A3) |
申请公布日期 |
2008.03.27 |
申请号 |
WO2007US10805 |
申请日期 |
2007.05.04 |
申请人 |
MICRON TECHNOLOGY, INC.;ROOHPARVAR, FRANKIE, F. |
发明人 |
ROOHPARVAR, FRANKIE, F. |
分类号 |
G11C16/04;G11C16/34 |
主分类号 |
G11C16/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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