SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE, IC CARD, AND INSPECTION DEVICE

摘要

PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit device capable of using a nonvolatile semiconductor memory in a normal state.

SOLUTION: Data of one reading unit is read from the lines X1 to X16 of a memory cell array 61 to investigate the presence of an error (A). For the line X16 corresponding to the error-detected data, data of all reading units are read (B). Thus, time for diagnosing a nonvolatile semiconductor memory 60 is shortened.

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