发明名称 HEATING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a heating device capable of increasing the temperature-rising rate of a semiconductor wafer by suppressing heat radiation from a glass type carbon heating element to the outside of a reaction vessel when raising the temperature of the semiconductor wafer and of increasing the temperature-reducing rate of the semiconductor wafer by releasing the heat radiation suppression state when reducing the temperature of the semiconductor wafer after terminating energizing a high frequency induction coil in a heating process of the semiconductor wafer by causing the glass type carbon heating element to generate heat by induction. SOLUTION: The heating device includes a reaction vessel 1 in which a semiconductor wafer W is accommodated, a glass type carbon heating element 2 arranged in the reaction vessel 1 and heating the semiconductor wafer W, a high frequency induction coil 3 arranged outside the reaction vessel 1 and causing the glass type carbon heating element 2 to generate heat by induction, and a movable heat reflecting plate 4 arranged between the reaction vessel 1 and the high frequency induction coil 3 and configured so that the states in opposition to the glass type carbon heating element 2 can be made differ between when the high frequency induction coil 3 is being energized and when the energizing is terminated. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008072080(A) 申请公布日期 2008.03.27
申请号 JP20070047493 申请日期 2007.02.27
申请人 KOBE STEEL LTD 发明人 HAMAGUCHI MAKI
分类号 H01L21/31;C23C16/46;H01L21/22;H01L21/324;H05B6/02;H05B6/10 主分类号 H01L21/31
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